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ScTMR: A scan chain-based error recovery technique for TMR systems in safety-critical applications

Ebrahimi, M ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. Publisher: 2011
  3. Abstract:
  4. We propose a roll-forward error recovery technique based on multiple scan chains for TMR systems, called Scan chained TMR (ScTMR). ScTMR reuses the scan chain flip-flops employed for testability purposes to restore the correct state of a TMR system in the presence of transient or permanent errors. In the proposed ScTMR technique, we present a voter circuitry to locate the faulty module and a controller circuitry to restore the system to the fault-free state. As a case study, we have implemented the proposed ScTMR technique on an embedded processor, suited for safety-critical applications. Exhaustive fault injection experiments reveal that the proposed architecture has the error detection and recovery coverage of 100% with respect to Single Event Upset (SEU) while imposing a negligible area and performance overhead as compared to traditional TMR-based techniques
  5. Keywords:
  6. Embedded processors ; Error detection and recovery ; Error recovery ; Exhaustive fault injection experiments ; Multiple scan chains ; Proposed architectures ; Roll-forward ; Safety critical applications ; Scan chain ; Single event upsets ; Testability ; TMR systems ; Fault detection ; Integrated circuit testing ; Recovery ; Restoration ; Safety engineering ; Error detection
  7. Source: Proceedings -Design, Automation and Test in Europe, DATE, 14 March 2011 through 18 March 2011 ; March , 2011 , Pages 289-292 ; 15301591 (ISSN) ; 9783981080179 (ISBN)
  8. URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5763277&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5763277