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Etched glass surfaces, atomic force microscopy and stochastic analysis

Jafari, G. R ; Sharif University of Technology | 2007

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  1. Type of Document: Article
  2. DOI: 10.1016/j.physa.2006.09.012
  3. Publisher: 2007
  4. Abstract:
  5. The effect of etching time scale of glass surface on its statistical properties has been studied using atomic force microscopy technique. We have characterized the complexity of the height fluctuation of an etched surface by the stochastic parameters such as intermittency exponents, roughness, roughness exponents, drift and diffusion coefficients and found their widths in terms of the etching time. © 2006 Elsevier B.V. All rights reserved
  6. Keywords:
  7. Atomic force microscopy ; Diffusion ; Etching ; Parameter estimation ; Random processes ; Surface roughness ; Drift ; Etching process ; Rough surfaces ; Roughness exponents ; Glass
  8. Source: Physica A: Statistical Mechanics and its Applications ; Volume 375, Issue 1 , 2007 , Pages 239-246 ; 03784371 (ISSN)
  9. URL: https://www.sciencedirect.com/science/article/pii/S0378437106009939