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A low-cost fault-tolerant technique for carry look-ahead adder

Namazi, A. R ; Sharif University of Technology | 2009

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  1. Type of Document: Article
  2. DOI: 10.1109/IOLTS.2009.5196019
  3. Publisher: 2009
  4. Abstract:
  5. This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques. © 2009 IEEE
  6. Keywords:
  7. Area overhead ; Carry look-ahead adder ; Fault-tolerant ; Look-ahead ; Parity prediction ; Power-delay products ; Single-bit ; Single-event transient ; Transient faults ; Adders ; Fault tolerance ; Transients ; Quality assurance
  8. Source: 2009 15th IEEE International On-Line Testing Symposium, IOLTS 2009, Sesimbra-Lisbon, 24 June 2009 through 26 June 2009 ; 2009 , Pages 217-222 ; 9781424445950 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/5196019