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The effect of grain size on the fluctuation-induced conductivity of Cu 1-xTlxBa2Ca3Cu4O 12-δ superconductor thin films

Khurram, A. A ; Sharif University of Technology | 2007

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  1. Type of Document: Article
  2. DOI: 10.1088/0953-2048/20/8/004
  3. Publisher: 2007
  4. Abstract:
  5. The high temperature superconductor thin films Cu1-xTl xBa2Ca3Cu4O12-δ (Cu1-xTlx- 1234) are post-annealed in a nitrogen atmosphere. The zero-resistivity critical temperature (Tc(R ≤ 0)) of these thin films is increased from 92.3 to 104K. The grain size is enhanced and their morphology is improved with the post-annealing. The enlargement of grain size is linked to fluctuation-induced conductivity (FIC) in the light of Aslamazov-Larkin (AL) theory. The FIC measurements have shown that the cross-over of three-dimensional (3D) to two-dimensional (2D) behaviour of fluctuations is shifted to higher temperature values with an increase of post-annealing temperature. These results have shown that the removal of oxygen and the increased grain size are the most likely sources of the increase in the cross-over temperature, T* to higher values. © IOP Publishing Ltd
  6. Keywords:
  7. Electric conductivity ; Grain size and shape ; Superconducting films ; Thin films ; Fluctuation-induced conductivity (FIC) ; Superconductor thin films ; Copper compounds
  8. Source: Superconductor Science and Technology ; Volume 20, Issue 8 , 2007 , Pages 742-747 ; 09532048 (ISSN)
  9. URL: https://iopscience.iop.org/article/10.1088/0953-2048/20/8/004