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Fast static characterization of residual-based ADCs

Hassanpourghadi, M ; Sharif University of Technology | 2013

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  1. Type of Document: Article
  2. DOI: 10.1109/TCSII.2013.2281908
  3. Publisher: 2013
  4. Abstract:
  5. Computationally exhaustive time-domain Monte Carlo (MC) simulations are commonly conducted to obtain the static characteristics of a residual analog-to-digital converter (ADC) (e.g., pipelined ADC) for the calculation of the integral nonlinearity (INL) and differential nonlinearity (DNL). In this brief, a new ultrahigh-speed, yet precise, behavioral-level dc characterization algorithm for residual-based ADC is introduced. The algorithm derives the transition points of a given stage of the ADC based on the random parameters of that stage. Then, it merges the dc characteristics of all stages together to extract detailed dc input-output characteristics for the entire ADC. Then, the exact amount of DNL and INL is derived. The proposed algorithm is verified by the results obtained through the conventional time-domain algorithm ran under several MC simulations. The INL and DNL of the algorithms are off by merely 1%. While the proposed algorithm obtains the INL in a few seconds, the conventional algorithm takes hours to achieve the same result. Fast calculation of the yield of the ADC is possible for a given set of values for the variance of stage parameters
  6. Keywords:
  7. Algorithm ; Analog-to-digital converter (ADC) ; Differential nonlinearity (DNL) ; High speed ; Integral nonlinearity (INL) ; Pipelined ADC ; Residual-based ADC ; Analog to digital converters ; Differential nonlinearity ; Pipelined ADCs ; Algorithms ; Analog to digital conversion ; Monte Carlo methods ; Time domain analysis
  8. Source: IEEE Transactions on Circuits and Systems II: Express Briefs ; Volume 60, Issue 11 , 2013 , Pages 746-750 ; 15497747 (ISSN)
  9. URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6615937