Sharif Digital Repository

Models capable of accurate simulation of microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation and prediction of the imaging results in amplitude modulation or tapping-mode atomic-force microscopy (AM-AFM or TM-AFM). In this paper, four approaches based on combinations of lumped and finite element methods for modelling of cantilever dynamics, and van derWaals and molecular dynamics for modelling of tip-sample interactions, are used to simulate the precise imaging by AM-AFM. Based on the simulated imaging and force determination, the efficiency of different modelling schemes is evaluated. This comparison is performed considering their... 

The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the biosample in contact and tapping modes may damage the sample structure and produce irreversible deformation, the noncontact mode of AFM (NC-AFM) is employed as the operating mode. The biosample is scanned using a carbon nanotube (CNT) as the AFM probe. CNTs because of their small diameter, high aspect ratio and high mechanical resistance attract many attentions for imaging purposes. The tip-sample interaction is simulated by the MD method. The protein, which has been considered as the biomolecule, is ubiquitin and a... 

Improvement of microcantilever-based sensors and actuators chiefly depends on how comprehensively they are modeled and precisely formulated. Atomic Force Microscopy (AFM) is the most widespread application of microcantilever beam as a sensor, which is usually influenced by the tip-sample interaction force. For this, vibration of AFM microcantilever probe is analyzed in this paper, along with analytical, numerical and experimental investigation of the influence of the sample interaction force on the microcantilever vibration. Nonlinear integro-partial equation of microcantilever vibration subject to the tip-sample interaction is then derived and numerically simulated. Moreover, multiple time... 

Models capable of accurate simulation of the microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation of the imaging results in non-contact atomic force microscopy (AFM). In the present research, a combination of finite element and molecular dynamics methods are used for modelling the AFM system to overcome the drawbacks of conventional approaches that use a lumped system with van der Waals interaction. To illustrate the ability of the proposed scheme in providing images with atomic resolution, some simulations have been performed. In the conducted simulations, a diamond tip is interacting with nickel samples having different surface plane... 

Frequency response behavior of microcantilever is analytically and experimentally investigated in amplitude modulation Atomic Force Microscopy (AFM). AFM microcantilever probe is modeled as a continuous beam, and tip-sample interaction force is considered to include both attractive and repulsive force regimes. The developed model is compared with the linear lumped-parameters model that has been extensively used in the literature so far. Experimental measurements are also provided for the frequency response of a typical microcantilever-sample system to demonstrate the advantages of the developed model over the linear formulation. The results indicate that the nonlinear continuous model is... 

The nonlinear flexural vibration for a rectangular atomic force microscope cantilever is investigated by using Timoshenko beam theory. In this paper, the normal and tangential tip-sample interaction forces are found from a Hertzian contact model and the effects of the contact position, normal and lateral contact stiffness, tip height, thickness of the beam, and the angle between the cantilever and the sample surface on the nonlinear frequency to linear frequency ratio are studied. The differential quadrature method is employed to solve the nonlinear differential equations of motion. The results show that softening behavior is seen for most cases and by increasing the normal contact... 

Improvement of microcantilever-based sensors and actuators chiefly depends on their modeling accuracy. Atomic force microscopy (AFM) is the most widespread application of microcantilever beam as a sensor, which is usually influenced by the tip-sample interaction force. Along this line of reasoning, vibration of AFM microcantilever probe is analyzed in this paper, along with analytical and experimental investigation of the influence of the sample interaction force on the microcantilever vibration. Nonlinear integropartial equation of microcantilever vibration subject to the tip-sample interaction is then derived and multiple time scales method is utilized to estimate the tip amplitude while... 

Improvement of microcantilever-based sensors and actuators chiefly depends on how comprehensively they are modeled and precisely formulated. Atomic Force Microscopy (AFM) is the most widespread application of microcantilever beam as a sensor, which is usually influenced by the tip-sample interaction force. For this, vibration of AFM microcantilever probe is analyzed in this paper, along with analytical, numerical and experimental investigation of the influence of the sample interaction force on the microcantilever vibration. Nonlinear integro-partial equation of microcantilever vibration subject to the tip-sample interaction is then derived and numerically simulated. Moreover, multiple time... 

Trolling mode atomic force microscopy (TR-AFM) has overcome many imaging problems in liquid environments by considerably reducing the liquid-resonator interaction forces. The finite element model of the TR-AFM resonator considering the effects of fluid and nanoneedle flexibility is presented in this research, for the first time. The model is verified by ABAQUS software. The effect of installation angle of the microbeam relative to the horizon and the effect of fluid on the system behavior are investigated. Using the finite element model, frequency response curve of the system is obtained and validated around the frequency of the operating mode by the available experimental results, in air... 

This paper focuses on the influences of the tip mass ratio (the ratio of the tip mass to the cantilever mass), on the excitation of higher oscillation eigenmodes and also on the tip-sample interaction forces in tapping mode atomic force microscopy (TM-AFM). A precise model for the cantilever dynamics capable of accurate simulations is essential for the investigation of the tip mass effects on the interaction forces. In the present work, the finite element method (FEM) is used for modeling the AFM cantilever to consider the oscillations of higher eigenmodes oscillations. In addition, molecular dynamics (MD) is used to calculate precise data for the tip-sample force as a function of tip... 

The finite element method and molecular dynamics simulations are used for modeling the AFM microcantilever dynamics and the tip-sample interaction forces, respectively. Molecular dynamics simulations are conducted to calculate the tip-sample force data as a function of tip height at different lateral positions of the tip with respect to the sample. The results demonstrate that in the presence of nonlinear interaction forces, higher eigenmodes of the microcantilever are excited and play a significant role in the tip and sample elastic deformations. Using comparisons between the results of FEM and lumped models, how some aspects of the system behavior can be hidden when the point-mass model is... 

In this paper, the hysteresis in the tipsample interaction force in noncontact force microscopy (NC-AFM) is measured with the aid of atomistic dynamics simulations. The observed hysteresis in the interaction force and displacement of the system atoms leads to the loss of energy during imaging of the sample surface. Using molecular dynamics simulations it is shown that the mechanism of the energy dissipation occurs due to bistabilities caused by atomic jumps of the surface and tip atoms in the contact region. The conducted simulations demonstrate that when a gold coated nano-probe is brought close to the Au(0 0 1) surface, the tip apex atom jumps to the surface, and instantaneously, four... 

This paper is devoted to investigate the nonlinear behaviors of a V-shaped microcantilever of an atomic force microscope (AFM) operating in its two major modes: amplitude modulation and frequency modulation. The nonlinear behavior of the AFM is due to the nonlinear nature of the AFM tip-sample interaction caused by the Van der Waals attraction/repulsion force. Considering the V-shaped microcantilever as a flexible continuous system, the resonant frequencies, mode shapes, governing nonlinear partial and ordinary differential equations (PDE and ODE) of motion, boundary conditions, frequency and time responses, potential function and phase-plane of the system are obtained analytically. The... 

Despite their simple structure and design, microcantilevers are receiving increased attention due to their unique sensing and actuation features in many MEMS and NEMS. Along this line, a non-linear distributed-parameters modeling of a microcantilever beam under the influence of a nanoparticle sample is studied in this paper. A long-range Van der Waals force model is utilized to describe the microcantilever-particle interaction along with an inextensibility condition for the microcantilever in order to derive the equations of motion in terms of only one generalized coordinate. Both of these considerations impose strong nonlinearities on the resultant integro-partial equations of motion. In... 

In this study, a novel artificial intelligence-based approach is presented to directly estimate the surface topography. To this aim, performance of different artificial intelligence-based techniques, including the multi-layer perceptron neural, radial basis function neural, and adaptive neural fuzzy inference system networks, in estimation of the sample topography is investigated. The results demonstrate that among the designed observers, the multi-layer perceptron method can estimate surface characteristics with higher accuracy than the other methods. In the classical imaging techniques, the scanning speed of atomic force microscope is restricted due to the time required by the oscillating...